Self-Heating And Parasitics Challenge Multi-Tier CFET Scaling (TU Munich, IIT Kanpur)

T2Covered by 1 source · first reported by Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly at 26 Oct, 07:01 UTC

Researchers at the Technical University of Munich and Indian Institute of Technology Kanpur published “Self-Heating and Parasitic Effects in Multi-Tier CFET Design.” Abstract Excerpt: “We study the impact of self-heating effects (SHEs) and middle of line (MOL) and back-end of line (BEOL) induced…

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Sources

• T2Self-Heating And Parasitics Challenge Multi-Tier CFET Scaling (TU Munich, IIT Kanpur)Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly26 Oct, 07:01