Emerson NI PXIe instruments for AI-accelerated automated testing

T2Covered by 1 source · first reported by Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly at 06 Nov, 11:03 UTC

Emerson has announced new NI PXI express instruments featuring an AI-accelerated approach to automated test. The goal, says the company, is to make the testing process more accessible to engineering […] The post Emerson NI PXIe instruments for AI-accelerated automated testing appeared first on…

hardware

Sources

• T2Emerson NI PXIe instruments for AI-accelerated automated testingSemiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly06 Nov, 11:03