From Functional Monitoring To In-System Test: Extending Voltage-Aware Observability

T2Covered by 1 source · first reported by Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly at 29 Oct, 07:05 UTC

Separate false failures caused by voltage droop from real structural defects. The post From Functional Monitoring To In-System Test: Extending Voltage-Aware Observability appeared first on Semiconductor Engineering.

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Sources

• T2From Functional Monitoring To In-System Test: Extending Voltage-Aware ObservabilitySemiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly29 Oct, 07:05