iPhone Duo Fails JerryRigEverything's Dusty Durability Test

T2Covered by 1 source · first reported by MacRumors / AppleInsider at 24 Oct, 18:27 UTC

Apple's iPhone Duo has failed JerryRigEverything's latest durability test. Despite its IP68 dust-resistance rating, dust entered the hinge through several ingress points, overwhelming the magnets that hold the phone shut. The bend test then left a permanent green line across the inner display…

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Sources

• T2iPhone Duo Fails JerryRigEverything's Dusty Durability TestMacRumors / AppleInsider24 Oct, 18:27