PVTW: Extending Silicon Characterization From PVT To Real-World Workload

T2Covered by 1 source · first reported by Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly at 22 Oct, 07:07 UTC

Two devices operating at exactly the same voltage, frequency, and temperature can behave differently depending on what they are being asked to do. The post PVTW: Extending Silicon Characterization From PVT To Real-World Workload appeared first on Semiconductor Engineering.

hardware

Sources

• T2PVTW: Extending Silicon Characterization From PVT To Real-World WorkloadSemiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly22 Oct, 07:07