Teradyne Magnum E2 addresses advanced DRAM and high-speed NAND flash

T2Covered by 1 source · first reported by Semiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly at 07 Oct, 14:34 UTC

The Teradyne Magnum E2 is a high-speed memory test system for advanced DRAM and flash interfaces. Its design, says the company, matches the test demands driven by AI and high-performance […] The post Teradyne Magnum E2 addresses advanced DRAM and high-speed NAND flash appeared first on Electronics…

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Sources

• T2Teradyne Magnum E2 addresses advanced DRAM and high-speed NAND flashSemiconductor Engineering / SemiWiki / EE Times / EE Journal / Electronics Weekly07 Oct, 14:34