Jedec unveils new standard for silicon photonics reliability qualification and testing

T2Covered by 1 source · first reported by JP/KR/TW: Korea Herald / Taipei Times / DigiTimes at 06 Oct, 03:52 UTC

Jedec released a new standard for silicon photonics (SiPh) testing and manufacturing controls to promote consistent reliability practices. The standard comes as SiPh experiences rapid growth due to its potential to replace copper interconnects amid AI infrastructure demand surges.

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Sources

• T2Jedec unveils new standard for silicon photonics reliability qualification and testingJP/KR/TW: Korea Herald / Taipei Times / DigiTimes06 Oct, 03:52